Dielectric relaxation in quadrupolar glasses is dominated at low temperatures by thermal activation over local anisotropy barriers produced by the quadrupolar freezing. The distribution of barrier heights V vanishes linearly as V→0 at all temperatures due to the repulsion of levels of the random internal stress tensor. A further shift of V to higher values occurs as T decreases due to correlations. These results are compared with recent dielectric measurements in (KBr)0.5(KCN)0.5.
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Home » Publications » Level repulsion and the dielectric relaxation in quadrupolar glasses
Level repulsion and the dielectric relaxation in quadrupolar glasses
Authors: I. Kanter and H. Sompolinsky
Year of publication: 1986
Journal: Phys. Rev. B 33, 2073(R) – Published 1 February 1986
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